Synchrotron X-ray Rietveld analysis of .ALPHA.-hafnium phosphate.
نویسندگان
چکیده
منابع مشابه
Synchrotron X-ray Analysis Demonstrate Phosphate-Bound Gadolinium in Skin in Nephrogenic Systemic Fibrosis
Figure 1. Light and synchrotron x-ray fluorescence (SXRF) microscopy images of the skin tissue showing element distribution. (a) Light microscopy; haematoxylin and eosin (H&E)-stained section of skin with dense fibrosis involving the dermis, extending into the subcutaneous tissue and containing areas of fibrocytes, osteoclast-like giant cells and tissue calcification. (b–g) Images of the tissue...
متن کاملQuantitative Rietveld analysis of CAC clinker phases using synchrotron radiation
The quantitative Rietveld analyses of twenty samples of CAC from four different manufacturers over the world, one synthetic mixture and a NIST standard were performed using synchrotron radiation. As compared with conventional XRD, synchrotron powder diffraction permitted to find new minor phases, improve the characterization of solid solutions of iron rich CAC phases and reduce preferential ori...
متن کاملSynchrotron X-ray Fluorescence Analysis of Dust Particles
Introduction: Synchrotron x-ray fluorescence (SXRF) studies carried out on a microprobe endstation allow non-destructive analysis of both major and trace element abundances in particles only microns in size. The technique has been applied to IDPs captured in the stratosphere to study atmospheric entry effects such as stratospheric contamination and frictional heating [1, 2]. SXRF will also be a...
متن کاملRietveld refinement of KLaTiO4 from X-ray powder data
Potassium lanthanum titanate(IV), KLaTiO(4), has been synthesized by conventional solid-state reaction. It crystallizes isotypically with the NaLnTiO(4) (Ln = La, Pr, Nd, Sm, Eu, Gd, Y and Lu) family. Five of the six atoms in the asymmetric unit (one K, one La, one Ti and two O atoms) are situated on sites with 4mm symmetry, whereas one O atom has 2mm. site symmetry. The crystal structure can b...
متن کاملSynchrotron radiation-induced total reflection X-ray fluorescence analysis
Synchrotron radiation-induced total reflection X-ray fluorescence (SR-TXRF) analysis is a high sensitive analytical technique that offers limits of detection in the femtogram range for most elements. Besides the analytical aspect, SR-TXRF is mainly used in combination with angle-dependent measurements and/or X-ray absorption near-edge structure (XANES) spectroscopy to gain additional informatio...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Analytical Sciences
سال: 1990
ISSN: 0910-6340,1348-2246
DOI: 10.2116/analsci.6.689